T5000 performs a large variety of Carrier Mobility experiments for the Thin-Film Transistor (TFT) with using user preferred parameters. You can get consistent and precise measurement data, directly analyze your results in the measurement software and speed up your research.
TFT Device or OTFT Device
Transfer Characteristic Curve
Output Characteristic Curve
Lifetime Evaluation and Aging Test
System Configuration
System Components
Dual Sourcemeter/Parameter Analyzer
Multichannel Voltage/LED Current Source
Test Jig/ThermoStation/Switching Unit
ProbeStation/TFT Parameter Test Software
System Specification
Model Name | T5000 Thin-Film Transistor Parameter Test System |
System Model/Option | SGX : Single channel, MTX : Multi channel / S : Standard Model, T : Thermal Stress Model, C : Light Stress Model |
System Configuration | Parameter Analyzer, Multichannel Voltage Source, Multichannel LED Current Source, Switching Unit, Sample Mounting Unit, Thermostation, Probestation, Microscope & Monitor |
Dimension | Size(mm3) : 1,000 x 1,000 x 1,000 / Weight(kg) : <200kg / Utility : 220V, 15A |
Sample | Thin Film Transistor(TFT), Oxide TFT, Organic TFT |
Sample Size | Glass Size : <50mm x 50mm |
Contact Type | Pogo Pin Type(Typical), Probe Tip(Probestation) |
Mobility Measure Range | <500cm2/V.sec |
Current Measure Accuracy | <10-12A |
Temperature Control Range | R.T. ~ 100℃, Air Cooling |
LED Light Control Current | Max. 500mA, 3W High Power White LED |
Measure/Analysis Item | Field Effect Mobility, Saturation Mobility, On/Off Ratio, Threshold Voltage, Sub-Treshold Swing Slope |
OLED & Display | Solar Cell & Photovoltaics | Battery & Electrochemical System | Flexible Electronics & Organic Semiconductor | LED & Optical System
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