Model Name  PV Module In-Line Inspection System K5500
Model Species  ELXB (Lamination Before), ELXA (Lamination After), ELXR (Repair). PLX
System Configuration  K301 Camera Set, K101 MDX DC Power Supply, Main Frame(Dark Room), Loader, Unloader, Conveyer, Control Unit
 Barcode Reader, PC & Monitor, Accessory
Camera number  ELXB : 6set, ELXA : 3set, ELXR : 2set, PLX : 6set
Auto detection  Mono > 2mm, Detection rate : 95% / Multi > 8mm, Detection rate : 80%
Tact Time  40 sec (option : 25 sec)
Measurement  Micro Crack, Printing/Firing Defects, EL/PL Intensity
Test Sample  Roller Conveyer Type, Strock : Maxl. 2,000mm, Speed : 400mm/sec, Accuracy : 100um
Interface  PLC, 24V I/O, TPC/IP
Dimension  ELXB(2,500mm x 2,400mm x1,500mm), ELXA(1,800mm x 2,400mm x 1,500mm), ELXR(2,100mm x 2,400mm x 1,500mm)
Test Sample  Crystalline Si Solar Module, Max. Size : 1,050mm x 2,000mm, Max. 8 x 12 Array Solar Module
Option  Barcoder(Manual,Auto), MES, Printer, TV, Hipot, Ground Bonding
Utility  220V Single Phase 30A, Air press 6bar

New Website of McScience Inc. K3000 Solar Cell I-V Test System. K3100 Solar Cell IPCE Measurement System. K3300 Solar Cell Imaging System. K3400 PV Response Measurement System. K5300 PV Module Imaging System. K5500 PV Module Inspection System. K5700 PV Module Light Soaking System. M6000 OLED Lifetime Test System. M6100 OLED I-V-L Test System. M7000 FPD Optical Test System. T3000 FPD Optical Test System. T4000 Organic Semiconductor Parameter Test System. T5000 TFT Parameter Test System. SimuLight™. Xe Series. New & Report. Product Review. Product of Solar Cell, Display, Battery, OLED test system. Contact Us, Company information, Global Partnership. BSYH Electronics Science & Technology Co., LTD. Advanced Optek Co., Ltd. Aseptec Sdn Bhd. Edge Tech Scientific PVT. LTd. Teknotip Analitik Sistemler Ltd. Sti.
In-Line PV Module Producti Inspection & Grading. Electroluminescence Imaging (EL). DC Resistance. Automatic Detection of Microcrack, Dark area & Finger Defect. Image Comparison Before / After Lamination. DCR Defect Detection.

TOP