ELECTRONIC TEST MODULE
Quintest 2.0

McScience’s Circuit Design

  • Robust Optimization for Device Characterization
  • Hybrid Design (Dynamic Response Source-Meter)
  • Functional Power Supply (DC and AC)
  • High-Speed Voltage, Current, Light, Temperature Measurement Modules and Interfaces
  • Extensible for Multi-Channel Systems
  • Patented Technology

  • CV-CC Control Circuit
  • Pulse Generation with Double Op-Amps
  • DC Bias Cancelling Circuit

    Quintest 2.0 Module

  • Microprocessor + FPGA
  • Digital Control Module
  • High Speed Core Clock
  • Expandable I/O Port
  • 5 Kinds of Input Function Generation (DC AC Step Ramp Pulse)
  • Voltage, Current, Light, Temperature Measurement Modules and High-Speed Interface
  • Programmable Test Sequence
  • Data Scratching
  • DC Cancelling with Analog Module
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