M3000 The development of “M3000 OLED Parameter Test System” is smoothly on its way here at McScience Inc. M3000 is a system that measures the properties of OLED using McScience’s own measuring device components. The previous test system used a darkroom that was large in volume causing inconvenience in moving or carrying the device. The new “M3000” excludes this darkroom to compactify the system, and also utilizes McScience’s original components instead of external products to improve price competitivity. As a modularized system, “M3000” also enables the users to switch between different types of aperture depending on their interests.
organic semiconductor parameter test system of McScience is advanced equipment for steady-state and transient characterization of solar cells and OLED. As leading test system for organic electronics and optoelectronics, T4000 offer all-in-one setups to solve time-consuming systematic measurements and address needs of our customers. User friendly software provides ease-of-use post-processing and parameter extraction for all measurement techniques:ㆍTransient Photovoltage (TPV) ㆍTransient Photocurrent (TPC) ㆍCharge Extraction (CE)
time-of-flight (TOF) measurement system of McScience is used to accurately measure carrier mobility of organic semiconductor. Mobility is a key parameter related to charge transport phenomena in organic semiconductor and performance of organic electronic and optoelectronic devices. The typical features of T3000 is compared to those of other manufacturer’ product below.What’s different New Feature McScience added new DIT and photo-CELIV mobility measurement mode, which require a function generator for loading pulse and ramp wave to DUT. In Photo-CELIV mode, a sample preparation is convenient because the sample’s thickness is less than 100 nm needed.